PROJECT TITLE :

Multi-step incremental ADC with extended binary counting

ABSTRACT:

A multi-step incremental ADC (IADC) with extended binary counting is proposed. It achieves high accuracy by splitting one conversion cycle into 2 serial steps. Throughout the first step, the ADC works as a 1st-order IADC (IADC1). The second step reuses the only integrator and extends the accuracy to eighteen bits by a binary counting technique. For the identical accuracy, the conversion cycle is shortened by a factor of a lot of than twenty eight as compared with the single-step IADC.


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PROJECT TITLE :Multi-step radiographic image enhancement conforming to weld defect segmentationABSTRACT:To improve the accuracy of automatic defect segmentation in radiographic non-destructive testing and analysis, the authors

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