PROJECT TITLE :
Method for determination of capture velocity of charge carriers into quantum well in semiconductor laser
A straightforward method for the determination of the capture velocity of charge carriers from a three-dimensional (3D) region (waveguide region) into a 2D region (quantum well) is proposed. The technique is predicated on measurement of the threshold current density and internal differential quantum efficiency in an exceedingly semiconductor laser structure. The technique also allows determining the 2D carrier density during a quantum well, which is otherwise not easy to measure during a multilayer laser structure.
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