Reflection phase of electromagnetic bandgap structure measurement based on parallel-plate waveguide system


A carefully designed parallel-plate waveguide measurement system is constructed to live the reflection phase of a compact electromagnetic bandgap (EBG) structure. A quasi-plane wave is created within the parallel-plate waveguide chamber, that is the basic condition of part measurement. Two EBG samples with totally different parameters are measured in this system. The information of the two samples agree well with those of infinite array EBG mode simulations, that proves that this measurement technique has sensible accuracy and reliability. This technique reduces the value of EBG reflection section measurement and the samples used in the experiment have a a lot of smaller size.

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