ABSTRACT:

A report is presented on high transconductance Gm measured on AlGaN/GaN HEMTs with a 12.5 nm-thick AlGaN barrier layer, grown on high resistivity silicon substrate using the MOCVD growth technique. 105 nm T-gate transistors were successfully fabricated using Pt/Ti/Pt/Au Schottky contact. Maximum current density of 723 mA/mm, current gain cutoff frequency of 80 GHz and maximum power gain cutoff frequency of 153 GHz are achieved. The devices feature a record peak extrinsic transconductance of 435 mS/mm which to the authors?? knowledge is the highest reported value for AlGaN/GaN HEMTs grown on Si (111). Different gatesource (Lgs) and drain-source (Lds) spacing were also designed to study their influence on the electrical device characteristics. The devices were fabricated in the framework of a tight collaborative project between OMMIC and IEMN.


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