PROJECT TITLE :
Multiscale statistically correlated variability: A unified model for computer-aided design
A easy analytical model of statistically correlated variability that unifies local and world variations is presented. This model is compatible with laptop-aided design (CAD) implementation, and covers device dimension-dependent mismatch, distance-dependent mismatch, and statistical across-chip variations during a single formulation. It's ready to explain the impact of correlated variability sources in the least scales, including the case where variability supply features parts with correlation lengths of the order of magnitude of typical device dimensions. This approach generalizes Pelgrom's analysis and can be simply implemented in CAD tools for Monte Carlo simulations of multiscale variability.
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