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The Noise Performance of Electron-Multiplying Charge-Coupled Devices at Soft X-Ray Energy Values

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PROJECT TITLE :

The Noise Performance of Electron-Multiplying Charge-Coupled Devices at Soft X-Ray Energy Values

ABSTRACT :

The utilization of electron-multiplying charge-coupled devices (CCDs) for prime-resolution soft X-ray spectroscopy has been proposed in previous studies, and also the analysis that followed experimentally identified and verified a modified Fano issue for X-ray detection using an $^55hboxFe$ X-ray supply. But, more experiments with soft X-rays at one thousand eV were less successful, attributed to excessive split events. Additional recently, through the employment of deep-depletion e2v CCD220 and on-chip binning, it's been attainable to greatly reduce the quantity of split events, allowing the result for the modified Fano factor at soft X-ray energy values to be verified. This paper appearance at the sooner attempt to verify the changed Fano issue at one thousand eV with e2v CCD97 and shows the problems created by splitting of the charge cloud between pixels. It then compares these earlier results with new data collected using e2v CCD220, investigating how split-event reduction permits the modified Fano factor to be verified for low-energy X-rays.


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The Noise Performance of Electron-Multiplying Charge-Coupled Devices at Soft X-Ray Energy Values - 4.8 out of 5 based on 49 votes

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