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Study From Cryogenic to High Temperatures of the High- and Low-Resistance-State Currents of ReRAM Ni–HfO2–Si Capacitors

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PROJECT TITLE :

Study From Cryogenic to High Temperatures of the High- and Low-Resistance-State Currents of ReRAM Ni–HfO2–Si Capacitors

ABSTRACT:

Resistive switching conduction in Ni/HfO2/Si capacitors is studied at temperatures ranging from seventy seven to 473 K. A model for the low-resistance state (LRS) in step with the experimental knowledge is proposed. The LRS current–voltage ( – ) curves show a maximum resistance, , at zero bias and a minimum worth, , at voltages close to reset, that indicates a departure from linearity. A three-parameter model for the – curves is reported and its temperature dependence analyzed.


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Study From Cryogenic to High Temperatures of the High- and Low-Resistance-State Currents of ReRAM Ni–HfO2–Si Capacitors - 4.9 out of 5 based on 70 votes

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