A 0.27e Read Noise 220- Conversion Gain Reset-Gate-Less CMOS Image Sensor With 0.11- CIS Process


A coffee temporal read noise and high conversion gain reset-gate-less CMOS image sensor (CIS) has been developed and demonstrated for the primary time at photoelectron-counting-level imaging. To realize a high pixel conversion gain while not fine or special processes, the proposed pixel has 2 distinctive structures: 1) coupling capacitance between the transfer gate and floating diffusion (FD) and a pair of) coupling capacitance between the reset gate and FD, for removing parasitic capacitances round the FD node. Consequently, a CIS with the proposed pixels is ready to achieve a high pixel conversion gain of and a coffee scan noise of zero.27e using correlated multiple-sampling-based mostly readout circuitry.

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