PROJECT TITLE :
Impact of Source–Drain Series Resistance on Drain Current Mismatch in Advanced Fully Depleted SOI n-MOSFETs
In this letter, we have a tendency to demonstrate the existence of the source-drain series resistance mismatch and its impact on drain current variability with regard to the opposite mismatch parameters. To this finish, we have a tendency to propose a brand new methodology for the drain current mismatch study primarily based on Y-function, enabling an explicit determination of the numerous variability sources in advanced totally depleted silicon on insulator (SOI) MOS devices.
Did you like this research project?
To get this research project Guidelines, Training and Code... Click Here