This work reports on the realization and test of a compact beam-profiling system for UV and X-ray sources, based on polycrystalline CVD diamond detectors. Multistrip and pixel structures have been used for 1-D and 2-D photodetectors, respectively. A dedicated read-out electronic circuitry has been designed and used to independently sample the signal produced by each strip (or pixel), enabling a real-time beam profile reconstruction.
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