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Broadband Microwave Characterization of Nanostructured Thin Film With Giant Dielectric Response

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PROJECT TITLE :

Broadband Microwave Characterization of Nanostructured Thin Film With Giant Dielectric Response

ABSTRACT:

This paper describes the extraction of the dielectric properties of a nanostructured thin film from two-port -parameter measurements on coplanar waveguide (CPW) lines. The CPW line is on high of a bilayer structure fashioned by a supporting glass substrate and a dielectric skinny film created by dispersing silver nanoparticles inside a polymer host. A dispersion mechanism because of internal inductance of the CPW line when calculating the effective dielectric constant is investigated. The extraction involves conformal-mapping approximation that uses closed-type equations to calculate the dielectric constant and also the loss tangent of every layer based on the effective dielectric constant and loss tangent of the complete structure. Additionally, computer-aided-style model with an instantaneous fitting technique are deployed for further investigation of potential multimode propagation for a CPW line with a substrate that includes a terribly giant dielectric constant. The results of the two techniques are compared and discussed. The measured dielectric constant ranges from to from 1 to 20 GHz with a loss tangent of 0.55 to 1.75 from one to 20 GHz.


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Broadband Microwave Characterization of Nanostructured Thin Film With Giant Dielectric Response - 4.8 out of 5 based on 49 votes

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