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Tracking of Triangular References Using Signal Transformation for Control of a Novel AFM Scanner Stage

1 1 1 1 1 Rating 4.78 (46 Votes)

ABSTRACT:

In this paper, we design feedback controllers for lateral and transversal axes of an atomic force microscope (AFM) piezoelectric tube scanner. The controllers are constrained to keep the standard deviation of the measurement noise fed back to the displacement output around 0.13 nm. It is shown that the incorporation of appropriate inner loops provides disturbance rejection capabilities and robustness against dc gain uncertainties, two requirements for satisfactory operation of signal transformation method. Simulations and experiments show significant improvement of steady-state tracking error with signal transformation, while limiting the projected measurement noise.


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Tracking of Triangular References Using Signal Transformation for Control of a Novel AFM Scanner Stage - 4.8 out of 5 based on 46 votes

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